منابع مشابه
Scanning-beam electron microscopy of Mycoplasma pneumoniae.
The morphology and the existence of a growth cycle of Mycoplasma pneumoniae have not been clearly established. There is disagreement as to whether this organism exists as a spherical or filamentous form, and whether it progresses from filamentous to spherical forms as the organism ages. A scanning-beam electron microscope (SEM) was utilized to provide detailed observations of the cycle of morph...
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Scanning-beam electron microscopic studies on an isolate from definite rheumatoid arthritis are presented.
متن کاملScanning ultrafast electron microscopy.
Progress has been made in the development of four-dimensional ultrafast electron microscopy, which enables space-time imaging of structural dynamics in the condensed phase. In ultrafast electron microscopy, the electrons are accelerated, typically to 200 keV, and the microscope operates in the transmission mode. Here, we report the development of scanning ultrafast electron microscopy using a f...
متن کاملFlash Scanning Electron Microscopy
Scanning Electron Microscopy (SEM) is an invaluable tool for biologists and neuroscientists to study brain structure at the intracellular level. While able to image tissue samples with up to 5 nm isotropic resolution, image acquisition is prohibitively slow and limits the size of processed samples. In this work, we propose a novel approach to speeding up imaging when looking for specific struct...
متن کامل“Smart Microscopy”: Feature Based Adaptive Sampling for Focused Ion Beam Scanning Electron Microscopy
A new method for the image acquisition in scanning electron microscopy (SEM) was introduced. The method used adaptively increased pixel-dwell times to improve the signal-to-noise ratio (SNR) in areas of high detail. In areas of low detail, the electron dose was reduced on a per pixel basis, and a-posteriori image processing techniques were applied to remove the resulting noise. The technique wa...
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ژورنال
عنوان ژورنال: Microscopy Today
سال: 2015
ISSN: 1551-9295,2150-3583
DOI: 10.1017/s1551929515000012